X-50 XRF Analyzer

The “classic” model for many applications at a great value.

The X-50 features PiN diode technology, which is the previous generation detector prior to the advent of silicon drift detectors. The PiN technology processes a factor of 10x – 20x lower X-ray rates than the silicon drift detectors, and has resolution that is about 70 eV less (greater width). However, for many applications, such as basic sorting of stainless, high temp, and copper alloys, or to analyze base or heavy metals in soils, ores, powders, etc., the PiN technology is satisfactory. The X-50 will NOT measure Mg, Al or Si in alloys. For some materials, X-50 can measure P and S at the 1% level. Limits of detection will be 3x higher (elevated) compared to SDD versions of the X. However, the X-50 features an attractive price point for the applications that work well. The X-50 includes the same advanced X-ray tube as other X models (operating at 40 kV max.), integrated camera, macro-camera, video, and the Android OS platform. The X-50 is available for alloy, environmental, mining/exploration, precious metals, car catalysts, coatings and an empirical app for industrial and user-customizable applications. Analyzers may be factory calibrated with fundamental parameters, Compton Normalization (EPA Method 6200), or user-defined empirical calibrations.

X-Ray Tube: 40 kV, Rh anode (alloy) or Au anode (Geochem, Soil, others)

Detector Rate: 7 mm2 PIN Diode, Standard DPP, 15k cps, 50% live

Metals & Alloys

Basic sorting of SS, high temps and red metals. Only sort Al alloys by MLC’s and 2000’s and 7000’s.

GeoChem & Soils

Same element suite as the X-100, but with older PiN diode detector technology. Test times will be much longer to achieve same precision as X-100, but X-50 platform lower priced.

Standard Element Package

The standard element package for the X-50 is shown in the table below.Require other elements? Just ask! We add or substitute elements frequently for specific applications.

Beam 1 (40 kV)
Beam 2 (10 kV)
Beam 3 (50 kV)
Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Nb, Mo, W, Ta, Au, Hg, Pb, Bi, U, Ag, Sn, Sb
S, K, Ca
Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Mo, W, Tl, Hg, Pb, Bi, Ag, Cd, Sn, Sb
Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Se, Y, Zr, Nb, Mo, W, Ta, Hf, Re, Au, Pb, Bi, Ru, Pd, Ag, Cd, Sn, Sb
Precious Metals
Ti, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, W, Au, Ge, Ir, Pt, Au, Pb, Bi, Zr, Mo, Ru, Rh, Pd, Ag, Cd, In, Sn, Sb


3.3 lbs with battery

Excitation Source

6-40kV, 200uA Rh anode for alloy testing, 6-50kV, 200uA Au anode for most other Apps.


Fundamental parameters. For Geochem and Env. Soil Apps, users may also choose “Compton Normalization” method and/ or use empirically derived calibrations.


7.25″ x 10.5″ x 4.5″


7mm2 PiN diode detector (active area), 190eV resolution FWHM at 5.95Mn K-alpha line.

Calibration Check

Internal shutter is also 316 stainless for totally automated calibration and energy scale validation.


On board rechargeable Li-ion battery, rechargeable inside device or with external charger, AC power, hot-swap capability (60s max swap time).

X-Ray Filtering

6 position filter wheel for beam optimization.

Environmental Temp. Range

10°F to 130°F at 25% duty cycle.


5″ color touchscreen Smartphone type display – PowerVR SGX540 3D graphic.

Processing Electronics Host Processor

ARM Cortex -A9 dual-core / 1.2GHz Memory: 1GB DDR2 RAM, 1GB NAND Results Storage: 8GB SD


Password protected usage (user level) and internal settings (admin).

Comms/ Data Transfer

Wifi, Bluetooth, USB. Connectivity to most devices, including SciAps Profile Builder PC software.

Pulse Processor

14-bit ADC with digitization rate of 80 MSPS 8K channel MCA USB 2.0 for high speed data transfer to host processor Digital Filtering implemented in FPGA for high throughput pulse processing 50nS – 24uS peaking time


CE, RoHS, USFDA registered, Canada RED Act.

Get Both With ONEBOX

Pair any Z Series with our industry-leading XRF unit and get optimal analysis across every element in the periodic table and every sample type. Same batteries, cables, chargers and other accessories.

LIBS: Analyze elements XRF can’t test: Li, Be, B, C, F, Na and more. Improved performance on Mg, Ca, K compared to XRF. Microanalysis with 100 um laser spot size.  

XRF: Great for transition and heavy metals. Easy to use, especially on bulk, soil, and ore type materials.

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Woburn, MA 01801
United States
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