X-200 XRF Analyzer
The X-200 offers comparable or superior speed and performance to the top end analyzers from other brands. It uses a top-performing SDD like the X-300 and a more standard version of pulse processing electronics. The X-200 has the same highly optimized X-ray tube and detector geometry as the X-300. The X-200 is rapidly becoming the choice for scrap processing and non-destructive testing due to the speed and analytical performance combined with the lightweight, small form-factor design. It’s fast on every alloy family including aluminum alloys. For geochemical applications, LODs are about 1.5x higher than the X-300, and it offers the same suites of elements for environmental, pathfinder, exploration and mining. Also available is the SciAps Empirical App for users that want to test other types of materials and generate their own calibration models. Analyzers may be factory calibrated with fundamental parameters, Compton Normalization (EPA Method 6200), or user defined empirical calibrations.
40 kV, Rh anode (alloy) or 50 kV Au anode (Geochem, Soil, others).
20 mm2 standard SDD and DPP. 125k cps, > 90% live.
Standard Element Package
The standard element package for the X-200 is shown in the table below. Require other elements? Just ask! We add or substitute elements frequently for specific applications.
|Application||Beam 1 (40 kV)||Beam 2 (10 kV)||Beam 3 (50 kV)|
|Geo-Mining||Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Nb, Mo, W, Ta, Au, Hg, Pb, Bi, U||Mg, Al, Si, P, S, K, Ca||Ag, Sn, Sb, Ba|
|Geo-Env Soil||Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Mo, W, Tl, Hg, Pb, Bi||Mg, Al, Si, P, S||Ag, Cd, Sn, Sb, Ba|
|Alloy||Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Se, Y, Zr, Nb, Mo, W, Ta, Hf, Re, Au, Pb, Bi, Ru, Pd, Ag, Cd, Sn, Sb||Mg, Al, Si, P, S||N/A|
|Precious Metals||Ti, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, W, Au, Ge, Ir, Pt, Au, Pb, Bi, Zr, Mo, Ru, Rh, Pd, Ag, Cd, In, Sn, Sb||N/A||N/A|
3.3 lbs with battery
7.25″ x 10.5″ x 4.5″
On board rechargeable Li-ion battery, rechargeable inside device or with external charger, AC power, hot-swap capability (60s max swap time).
5″ color touchscreen Smartphone type display – PowerVR SGX540 3D graphic.
Wifi, Bluetooth, USB. Connectivity to most devices, including SciAps ProfileBuilder PC software.
6-40kV, 200uA Rh anode for alloy testing, 6-50kV, 200uA Au anode for most other Apps.
20mm 2 silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K-alpha line.
6 position filter wheel for beam optimization.
Processing Electronics Host Processor
ARM Cortex -A9 dual-core / 1.2GHz Memory: 1GB DDR2 RAM, 1GB NAND Results Storage: 8GB SD
14-bit ADC with digitization rate of 80 MSPS 8K channel MCA USB 2.0 for high speed data transfer to host processor Digital Filtering implemented in FPGA for high throughput pulse processing 50nS – 24uS peaking time
Fundamental parameters. For Geochem and Env. Soil Apps, users may also choose “Compton Normalization” method and/ or use empirically derived calibrations.
Internal shutter is also 316 stainless for totally automated calibration and energy scale validation.
Environmental Temp. Range
10°F to 130°F at 25% duty cycle.
Password protected usage (user level) and internal settings (admin).
CE, RoHS, USFDA registered, Canada RED Act.
Update to the X-250 with the 500 uA tube current in the low voltage beam. Improves limits of detection on Mg, Al, Si, P and S by 2X over the X-200, or improves speed by 4X for same LODs. Our special Scrap version of the X-250 with the FAST AL App let’s you sort every aluminum alloy in 2 seconds. Also a lower cost option to the X-350 for low silicon, phosphorus and sulfur in steels, ores and geochem samples.